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Start-up licenses X-ray optimization tool from Berkeley National Lab

By David Schwartz
Published: December 23rd, 2015

MiTGen LLC, a start-up specializing in X-ray technology, has licensed a technology from Lawrence Berkeley National Laboratory that measures the intensity of X-ray beams.

Developed by Berkeley researchers Diane Bryant and Simon Morton, the diode beam stop (DBS) technology is designed to optimize X-ray beam lines, which are critical for the advancement of potentially lifesaving innovations in material, biological and medical sciences.

“The work done by the team at Lawrence Berkeley National Lab has resulted in a great tool for monitoring X-ray diffraction experiments,” says Robert Newman, CEO of MiTGen. “The diode beam stop device will enable researchers to obtain real-time information about the intensity of the X-rays hitting their samples. We here at MiTGen are very excited to bring this enabling technology to the marketplace and help push research forward.”

Under the exclusive licensing agreement, the start-up will develop and commercialize products utilizing the Berkeley technology, specifically an improved beamstop for both synchroton beam lines and home sources. MiTGen aims to have a product available by July 2016.

“MiTGen’s implementation plans demonstrate the importance of industry partnerships to achieving Berkeley Lab’s mission of delivering science solutions to the world,” says Elsie Quaite-Randall, chief technology officer at Berkeley. “Technology licensing, as in the case of MiTGen, along with collaborative research, industry consortia and other partnership models, are crucial to launching innovative discoveries into the marketplace where they can benefit society.”


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